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New Diagnostic Test Helping in the Fight Against Ovarian Cancer 20 Aug 2010: A new test for ovarian cancer was demonstrated to be 99% to 100% accurate over 100 patient samples by Researchers at Georgia Institute of Technology. This new diagnostic technique is able to test a single drop of blood serum using JEOL's AccuTOF™-DART® mass spectrometer. JEOL USA
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New DART SVP Source and iDART Automation Streamline JEOL AccuTOF-DARTTM Time-of-Flight Mass Spectrometer Performance
25 Jan 2010: JEOL’s award-winning AccuTOF-DART™ mass spectrometer, featuring the new iPod touch-enabled DART SVP ion source, offers a new set of performance features for accurate mass measurements in real time using advanced time-of-flight technology. The DART SVP (simplified voltage and pressure), integrates sample automation with flexibility in set up and positioning of the sample for rapid, repeatable performance. JEOL USA
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JEOL Celebrates 60th Anniversary at Pittcon
05 Mar 2009: JEOL, renowned for its role in the development and manufacture of advanced electron microscopy and spectroscopy products since 1949, kicks off its 60th anniversary celebration at Pittcon (Chicago, March 8-13, 2009), the premier conference and exposition on laboratory sciences. JEOL USA
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Third Edition of Mass Spec Applications Booklet for Direct Analysis in Real Time (DART®)
26 Jun 2007: JEOL USA has recently published the third edition of its popular AccuTOF-DART Direct Analysis in Real Time mass spectrometry applications notebook. JEOL USA
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Pacific Chemistry Professor and Student Discover Breakthrough Testing Method for Pet Food 26 Apr 2007: A professor and graduate student in University of the Pacific’s chemistry department have developed a new method for determining how to identify foreign substances in pet food. The breakthrough discovery allows scientists to determine whether pet food has been contaminated in a matter of minutes. JEOL USA
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JEOL Technics Ships 10,000th Unit
29 Mar 2007: JEOL USA, a leading supplier of scientific instruments in the Americas, is proud to announce that JEOL Techniques, one of the company’s design and manufacturing branches in Akashima, Japan, has shipped its 10,000th Scanning Electron Microscope (SEM). JEOL USA
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JEOL DART mass spectrometer ion source awarded second patent
29 Nov 2006: JEOL USA Inc. today announced that the DART™ (Direct Analysis in Real Time) technology for open-air mass spectrometry has been awarded U.S. Patent No. 7,112,785 by the U.S. Patent and Trademark office. The patent covers the method of ionization of the DART process. JEOL USA
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JEOL USA Receives Sixth Consecutive Omega Award for Service
14 Sep 2006: For the sixth consecutive year, JEOL USA, Inc., a leader in the manufacture, sales, and service of electron microscopes and analytical instruments, has received the Omega Northface Award in recognition for its commitment to providing exemplary service and exceeding customer expectations. JEOL USA
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High Throughput Screening of Counterfeit Drugs Described in New Paper on Novel Mass Spectrometry Techniques
11 Aug 2006: A new technical paper describes the use of direct analysis in real time (AccuTOF-DART) mass spectrometry for rapid screening and analysis of counterfeit drugs. JEOL USA
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New Paper Describes Direct Analysis of 43 Writing Inks Using JEOL DART™ Mass Spectrometry
11 Aug 2006: A new technical paper describes the use of direct analysis in real time (AccuTOF-DART™) mass spectrometry for writing ink analysis performed for forensic applications. JEOL USA
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